Transmission electron microscope (TEM) 120 KV JEOL 1210.
The 120 KV JEOL 1210 TEM features a high angular range (Tilt X= ± 60o, Tilt Y= ± 30o) providing a unique facility in the area of Barcelona for exploring large volumes of the reciprocal lattice by electron diffraction. It has technical support by a high profile (Dr) staff member. With a resolution below 3.2 Å this equipment is useful for low resolution structure imaging and characterization of nanoparticulate systems.
When operating in image mode TEM provides information about the size, morphology and microstructure of the samples.
In diffraction mode, it allows the determination of the cell parameters, space group and superstructures, incommensurate modulations, etc.
Holder: Analytical specimen holder, doble tilt ( Tilt X=± 60o, Tilt Y=± 30o ) GATAN 646.
Camera: ORIUS 831 SC 600, GATAN.